Fluorescence Imaging with Nanometer Precision Using Spectral Self-interference Microscopy
نویسندگان
چکیده
Spectral Self-Interference Fluorescence Microscopy (SSFM) has been shown to allow nanometer-scale localization of fluorescent layers placed above a reflecting substrate. A MonteCarlo analysis is used to show how this high localization accuracy can still be expected at the low signal levels associated with single-molecule studies. Discrimination of fluorophores separated by a few tens of nanometers is also demonstrated. The results achieved indicate that SSFM may be applied to total internal reflection fluorescence microscopy to axially resolve objects within the evanescent excitation volume.
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